Here the list of the 2016 IFES Fellows
Nominated | Current Affiliation | Citation statement |
George Smith |
Oxford University | For more than 45 years of contributions and commitment to the field of atom probe field ion microscopy. |
Richard Forbes |
University Surrey | For his many contributions to the growth of the theory and understanding of field electron and ion emission as well as his contributions to the society. |
Michael Miller |
For seminal contributions in the development and application of atom probe tomography as demonstrated by his 600+ publications, service to the community, and impactful collaborations with numerous international scientists and engineers in their development and use of atom probe tomography. | |
Thomas Kelly |
Cameca Inc. | For revolutionizing atom probe technology with the invention of the LEAP, and for service to the IFES community as President of the society. |
David Seidman |
Northwestern University | Having advised more than 120 individuals with 450+ publications, David Seidman's materials research based on APT and technique developments has laid a solid groundwork for atom probe groups worldwide. |
Alfred Cerezo |
Oxford University | For development of the position sensitive atom probe, which opened new dimensions and perspectives in both material science and instrumentation. |
Guido Schmitz |
University Stuttgart | For his contribution to understanding diffusion and other atomic scale metallurgical processes studied using atom probe tomography. |
Hans-Olof Andrén |
Chalmers University | For development of atom probe techniques, and for his use of atom probe instruments as materials science tools to study the detailed microstructure of primarily metallic materials. |
Tien Tzou Tsong
|
Academia Sinica | For observation of the interaction between adsorbed on metal surfaces and for seminal research involving the use of a laser to promote thermal field evaporation. |
Krystyna Stiller |
Chalmers University | For fruitful use and development of atom probe techniques contributing to understanding of radiation damage, phase transformations, interfacial segregation and high temperature oxidation, and for promoting atom probe techniques. |
Hans Juergen Kreuzer |
Dalhousie University | Published more than 325 papers, 8 books, and 6 patents in the area of physics and chemistry of high electric fields. |
Marwan Mousa |
Mu'tah University | For outstanding contributions to field emission science and for service to the society including organization of the 45th IFES. |
Norbert Kruse |
Washington State University |
For sustained contributions towards understanding chemical physics at materials surfaces and outstanding service to the high field nanoscience and atom probe communities. |
Georgiy Fursey |
Saint-Petersburg St. University of Telecomm. | For wide-ranging, outstanding contributions to field electron emission science and technology, particularly explosive emission and emission from semiconductors. |
Gary Kellogg |
For fundamental technical contributions to laser-pulsed atom probe instrumentation and numerous aspects of surface and materials science, and for extraordinary service to the nanoscience community. | |
Simon Ringer |
University Sydney | For outstanding research in atom probe science, sustained IFES community service, including as Vice President and conference organiser and his role in training a new generation of field emission scientists. |
Lyn Swanson |
FEI | For outstanding scientific contributions to characterisation and development of field electron/ion emitters, and technical and managerial leadership of FEI Company in commercially developing these emitters and related instruments. |
Kazuhiro Hono |
Nat'l Inst. Of Materials Science, Tsukuba | For key contributions to the growth of atom probe, developments in instrumentation, and broad utilization of the technique to impact the study of magnetic materials and precipitation hardening. |
Robert Gomer |
University Chicago | For outstanding contributions to science, especially areas of field electron and ion emission and their application to problems in surface chemistry, and for public service. |
Paul Cutler |
Penn State University | For working on theory of field electron and ion emission over more than 50 years, developing quantum mechanical models to explain and predict the behavior of field electron emitters. |
Didier Blavette |
University Rouen | For unique contributions to atom probe field ion microscopy spanning the fundamental physics of the technique, instrumentation, and cutting-edge materials characterization. |
Allan Melmed |
Allan Melmed is one of the most distinguished scientists of the IFES community, with a lifetime experience in field emission since his PhD thesis with the late EW Müller. | |
John Panitz |
University New Mexico | As one of the inventors of the atom probe technique, John Panitz’ contributions and vision for the technique enabled its large acceptance in the international realm of materials characterization. |
Osamu Nishikawa |
Kanazawa Inst. of Tech. | For outstanding contributions to atom probe becoming a mainstream scientific instrument in hundreds of laboratories around the world. |